FORTH WORTH, Texas, Oct. 27, 2017 /PRNewswire/ -- Optimal+ will exhibit and present at the International Test Conference (ITC) Oct. 31 - Nov. 2, 2017. Optimal+ CTO Michael Schuldenfrei will present on how Machine Learning is becoming essential for manufacturing operations to achieve the next level of product quality in semiconductor and electronic systems. The company is the Diamond Sponsor for ITC and will be exhibiting its award-winning solutions at booth 208.
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WHAT: |
As semiconductor and electronics companies strive to achieve a level of quality that is measured in parts-per-billion, many are turning to Machine Learning (ML) as an essential vehicle to meet these new quality requirements. Optimal+ will lead a presentation "Machine Learning as a Platform for the Future" that discusses how to implement a real-world ML system for semiconductor and electronics manufacturing and the many benefits that ML can provide to improve quality, yield and productivity.
In addition, Optimal+ will be exhibiting at booth 208 during the event. The company will show the latest capabilities in advanced product data analytics and discuss why Fortune 500 companies around the world trust Optimal+ to process over 50 Billion devices on their behalf every year. |
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WHO: |
Optimal+ CTO Michael Schuldenfrei. Schuldenfrei brings over 25 years of software and information technology experience to the event, before joining Optimal+ in 2005 as its CTO, Schuldenfrei was a senior software architect at SAP, where he led the development of Duet, a joint venture with Microsoft to enable seamless access to SAP data via Microsoft Office. Prior to joining SAP, Schuldenfrei was a Software Architect at Microsoft, where he led consulting engagements with the company's major customers. |
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WHEN: |
Tuesday, October 31, 2017 at 11:00am. Lunch will be provided. |
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WHERE: |
International Test Conference, Fort Worth Convention Center in the Plenary Room. |
About 2017 International Test Conference (ITC)
ITC is the world's premier conference dedicated to the electronic test of devices, boards and systems-covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. In its forty year history, ITC has become the world's leading electronics test conference . No other industry has changed as much – or changed the world as much – in those forty years as semiconductor technology. ITC has kept pace, always seeking to develop new and innovative ways to fulfill its primary objective: the exchange of technical information.
About Optimal+
Optimal+ is the only big data analytics software company providing an end-to-end solution that measurably improves quality, yield, and productivity for semiconductor and electronics manufacturing. From chip to board to system, our enterprise-grade solutions ensure that all of your global manufacturing data is collected, cleaned and analyzed in real time, enabling decisive actions that enhance, certify and monitor the quality of semiconductor and electronic products over their entire lifetime. With over 50 billion devices processed annually, Optimal + provides Manufacturing Intelligence™ solutions that enhance yield and productivity, reduce RMAs and usher in an age of robust, long-term quality products. For more information, visit www.optimalplus.com. Follow us on Twitter @OptimalPlus.
CONTACT:
Joe McGurk
joe@cutlerpr.co
SOURCE Optimal+